Performance And Reliability Of Semiconductor Devices
Condition: SECONDHAND
This is a secondhand book. The jacket image is a photograph of the exact copy we have in stock. This image shows the condition of this book. Further condition remarks are below.
Author: Michael Mastro, Jeffrey Laroche, Jun Bae, Jin-Woo Kim, Myung-Soo Kim
Binding: Hardback
Publisher: MRS MATERIALS RESEARCH SOCIETY, 2009
Condition remarks:
Book: Good
Jacket: N/A
Pages: Good
Markings: No markings
This academic text addresses the critical aspects of semiconductor device engineering. It details the intricate mechanisms governing the operational performance and long-term reliability of various semiconductor components. The work presents comprehensive analyses of failure modes and degradation processes, offering insights crucial for advanced device design. It further illustrates methodologies for enhancing durability and ensuring consistent functionality in cutting-edge electronic systems. This authoritative volume is an essential resource for researchers and professionals in materials science and electrical engineering.
Author: Michael Mastro, Jeffrey Laroche, Jun Bae, Jin-Woo Kim, Myung-Soo Kim
Format: Hardback
Published: 2009, MRS MATERIALS RESEARCH SOCIETY
Author: Michael Mastro, Jeffrey Laroche, Jun Bae, Jin-Woo Kim, Myung-Soo Kim
Binding: Hardback
Publisher: MRS MATERIALS RESEARCH SOCIETY, 2009
Condition remarks:
Book: Good
Jacket: N/A
Pages: Good
Markings: No markings
This academic text addresses the critical aspects of semiconductor device engineering. It details the intricate mechanisms governing the operational performance and long-term reliability of various semiconductor components. The work presents comprehensive analyses of failure modes and degradation processes, offering insights crucial for advanced device design. It further illustrates methodologies for enhancing durability and ensuring consistent functionality in cutting-edge electronic systems. This authoritative volume is an essential resource for researchers and professionals in materials science and electrical engineering.